Key Features

Unrivaled Benefits

Wavelength Scanning t0 175 nm

No additional option is required to scan below 185 nm (N ₂ purging must be used)

High Sensitivity PMT

Gridless PMT design provides improved signal to noise in the UV region

Standard Sample and Reference Beam Attenuators

Included in basic instrument. No loss of sample compartment room.

Standard RS232 Interface

No computer compatibility problems

Principle

Double beam, double monochromator, ratio

recording UV/Vis spectrophotometer vvith microcomputer electronics, controlled by DELL PC or compatible Personal Computer.

Optical System

All reflecting optical system (SiO ₂ coated)

with holographic grating monochromator with

1440 Lines/mm UVNis blazed at 240 nm,

Littrow mounting, sample thickness

compensated detector optics.

Beam Splitting System

Chopper (46+ Hz, Cycle: Dark/Sampie/Dark/

Reference, Chopper Segment Signal Correction

CSSC).

Detector

Photomultiplier R6872 for high energy in the

whole UV/Vis wavelength range.

Source

Pre-aligned tungsten-halogen and deuterium.

Wavelength Range

(N ₂ purge required below 185 nm)

175 nm-900 nm

UV/Vis Resolution

< 0.05 nm

Stray Light

At 200 nm (12 g/L KCI USP/DAP method)

At 220 nm (10 g/L Nal ASTM method)

At 340 nm (50 mg/L NaNO ₂ ASTM method)

At 370 nm (50 mg/L NaNO ₂ ASTM method)

> 2 A

< 0.00008 %T

< 0.00008 %T

< 0.00008 %T

Wavelength Accuracy

+/- 0.08 nm

Wavelength Reproducibility

UV/Vis (Deuterium Lamp Lines)

Standard deviation of 10 measurements UV/Vis

< 0.020 nm

< 0.005 nm

Photometric Accuracy

Double Aperture Method 1 A

Double Aperture Method 0.5 A

N IST 1930D Filters 2 A

NIST 930D Filters 1 A

NIST 930D Filters 0.5 A

K ₂ Cr ₂ 0 ₇ -Solution USP/DAP method

+/- 0.0006 A

+/- 0.0003 A

+/- 0.003 A

+/- 0.003 A

+/- 0.002 A

+/- 0.010 A

Photometric Linearity

(Addition of filters UV/Vis at 546.1 -nm,

Slit 2 nm, 1-sec. Integration Time)

At 1.0 A

At 2.0 A

At 3.0 A

+/-0.001A

+/- 0.002 A

+/- 0.006 A

Photometric Reproducibility

1 A wich NIST 930D Filter at 546.1-nm

Standard Deviation for 10 measurements

0.5 A wich NIST 930D Filter at 546.1-nm

Standard Deviation for 10 measurements

0.3 A wich NIST 930D Filter at 546.1-nm

Standard Deviation for 10 measurements

(2-nm Slit, 1 -sec. Integration)

< 0.00016 A

< 0.00008 A

< 0.00008 A

Photometric Range

7 A (wich SRATT)

Photometric Display

Unlimited

Bandpass

0.05 nm-5.00 nm in 0.01 -nm increments

UV/Vis range

Fix resolution, constant energy or slit

programming.

Photometric Stability

(After warm-up at 500 nm, 0 A, 2-nm Slit,

2-sec. Integration Time, Peak to Peak)

< 0.0002 A/h

Baseline Flatness

(Lambda 900:190 nm-3100 nm, 2-nm Slit,

Gain 1 NIR, 0.20-sec. UV/Vis-0,24-sec.

NIR Integration Time, no smoothing applied)

(Lambda 800: 190 nm-860 nm, 2-nm Slit,

0.20-sec. Integration Time, no smoothing applied)

+/- 0.001 A

Photometrie Noise RMS

0A and 190 nm

0 A and 500 nm

2 A and 500 nm

4A and 500 nm

6 A and 500 nm

(2-nm Slit, 1-sec.Integration Time, Gain 1 NIR)

< 0.00010 A

< 0.00005 A

< 0.00020 A

< 0.00100 A

< 0.00500 A

Sample Compartment Instrument

(W x D x H)

200 mm x 300 mm x 220 mm

Purging

Optics

Sample Compartment

YES

YES

Instrument Dimension (W x D x H)

1020 mm x 630 mm x 300 mm

Instrument Weight

- 55 kg

Digital 1/0

RS 232 C

Light Beam

90 mm above the base plate

120 mm beam separation

3 mm-12 mm beam height

Instrument Requirements

Power

Temperature

Recommended Humidity

90VAC-250VAC,50/60 Hz; 400VA

10°C-35,C

10-70% relative humidity, non-condensing