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Objektnummer	B00018564
Seriennummer	018564
Nome oggetto	Perkin Elmer FTIR 1725x
Stato	Archiv

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DE, AT, CH	Payment by invoice, payment in advance, payment by credit card	Payment by invoice is only possible for corporate clients.
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Definition of status

All articles are used articles, except an article is listed especially as a new device.

Status	Condition	Comment
Immediately available	Used	The article is fully functional and in impeccable condition. It can be shipped immediately.
In stock	Used	The article is on stock. Our service technicians will verify the article before delivery. You are receiving only a fully functional article.
Published	Used	The article is still with the provider. After your order the article will be purchased and verified by us before being shipped to you. A certificate of operativeness as well as a service report are included in delivery.
New device	new	The article is brand new and unused. Regarding new equipment the guarantee/warranty conditions of the corresponding manufacturer apply.
Labprocure	Used	Labprocure GmbH, as the advertiser, is responsible for the content of this device offer. Labprocure assumes liability for the offers advertised here and for the photos and offer texts included. Labprocure GmbH, Bruckstraße 58, 72393 Burladingen.

Firma: Perkin Elmer

Modell: 1725 X

Kommentar: Dokumente engl. (für ID. 11180)

The following illustrations and descriptions are referring to the instrument model and are drawn from brochures. They are not representing the delivery volume. The exact delivery content you will find only in the offering text.

Perkin Elmer FTIR-Spektrometer 1725 X

The Perkin-Elmer Model 1725X is a new benchtop FT-IR spectrometer controlled by an IBM® PC-AT, PS/2 or compatible computer. Equally at home in a routine analytical or research environment, the Model 1725X has optical and data handling facilities to match the most demanding applications. Stability and sensitivity levels are second to none, providing the most reliable results in the shortest time. In common with the other members of the 1700X Series, the optical unit is sealed and desiccated, removing the need to purge for most applications. Sample turnaround time is typically seconds rather than minutes.

The Infrared Data Manager and Instrument Control software packages use a mouse driven window environment to provide logical and user friendly interaction. Spectral SEARCH, quantitative analysis and macro-programming packages are also available. Data import and export facilities are provided using industry standards such as JCAMP-DX and Lotus® 1-2-3. These provide a gateway to a host of third-party software packages and network systems and ensure that the Model 1725X can be fully integrated into the computer controlled laboratory.

FEATURES

n Research level performance

Range, resolution and sensitivity levels normally associated with research spectrometers allow the Model 1725X to handle the most demanding applications.

n The PC advantage

PC control and data compatibility provide a link with the expanding world of industry standard hardware and software.

n Friendly, versatile software

A mouse-driven window software environment is ideal for both routine and research users.

n FuIIy upgradeable

The Model 1725X is compatible with every accessory and upgrade expected of a research level FT-IR spectrometer, including IR microscopy, GC-IR and external beam facilities.

The Model 1725X

Specifications

Principle:

1700X Michelson interferometer with frictionless electromagnetic drive and bidirectional data collection. Auto interferometer alignment.

Optics:

Multicoated KBr beamsplitter standard. Csl, near and far-IR beamsplitters available.

Sealed, desiccated optics. Purge possible but not an instrumental requirement.

Source:

Temperature stabilized ceramic, air cooled standard. QuartziHalogen available for the near-IR.

Detector:

Temperature stabilized, fast recovery DTGS standard. Wide, medium or narrow band MCT detector can be installed simultaneously with DTGS. Other near and far-IR detectors available.

Wavenumber range:

7900 370 cm^-1 standard.

15,000 30 cm^-1 with various near or far infrared options.

Resolution:

At least 2 cm^-1 to 64 cm^-1 standard. 0.5 cm^-1 available.

Signal-to-noise:

>3000:1 p-p (15,000:1 RMS) in the region of 2000 cm^-1 , 4 second measurement at 4 crn^-1 resolution with DTGS detector.

Up to 30 times higher sensitivity with MCT under low energy conditions.

External beam:

Choice of parallel or focused beam, detectors and configuration of auxiliary bench available.

Scan speeds:

5 speeds between 0.1 and 2.0 cm.s^-1 o.p.d. velocity.

Accessories:

Full range of IR sampling accessories. Infrared microscopes, GC-IR and TG-IR accessories. Photoacoustic detector. Sample shuttle for effective double beam Operation.

Size & Weight:

Optical unit

815 mm bong; 269 mm high 610 mm deep; 70 kg

Electronics unit

325 mm Jong; 269 mm high; 610 mm deep; 24 kg.

Power requirements:

200 to 240 V; 50 or 60 Hz

100 to 117 V; 50 or 60 Hz

250 VA

Data Handling

Data System:

IBM PC-AT, PS/2 or equivalent. Contact Perkin-Elmer for exact configuration.

Operating System:

Mouse-driven window environment operating under MS-DOS®.

Graphics:

EGA high resolution color graphics. Multiple spectra can be displayed and manipulated interactively.

Memory:

640 KByte RAM and 2 MByte extended memory.

Data storage:

Choice of floppy disks, Winchester drives and other PC compatible storage devices.

Hard copy output:

8-color single page plotter. Dot matrix printer.

Communications:

IEEE-488 or RS232C communication with spectrometer. Data import and export via JCAMP-DX and Lotus 1-2-3 format to most thirdparty software data handling and networking packages.

Software:

1700 instrument control and Infrared Data Manager (IRDM) are standard. Other infrared packages include:

OBEY macroprogramming package

PC SEARCH Expert spectral interpretation package

PC QUANT Least-squares multicomponent quantitative analysis.

Details of these software packages can be found in the relevant data sheets.

Gruppo prodotti: FTIR-Spettrofotometri

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