Layer thickness measuring

Skyray EDX 2000A

€18,664.00
Excl. 19% VAT , excl. Shipping Cost
€22,210.16 incl. Vat
ID-number: 43492
Status: New DeviceThe article is brand new and unused. Regarding new equipment the guarantee/warranty conditions of the corresponding manufacturer apply.?This is a new device. The equipment is unused and factory sealed. For new equipment the warranty of the manufacturer and the statutory warranty period shall apply.
Shipping: 4-6 weeks
Description:
Skyray XRF micro film thickness analyser EDX 2000A.
For non-contact micro-range coating thickness measurement in
industries such as semiconductors, chips and printed circuit boards, electrical appliances
and aerospace.
The automatic three-dimensional movement of the platform
along the X, Y and Z axes, a dual laser positioning system and a safety
and a safety protection system, fast focussing and precise analysis of various simple and complex samples such as planar, concave-convex, angular and curved surfaces can be realised.
Measuring range of the coating: 3 Li to 92 U.
Measuring range of the elements: 13 Al to 92 U.
Simultaneous determination of: 24 elements and more than 5 coatings.
Measuring range: Coatings in the range of 50 µm with a detection limit
detection limit at approx. 0.01 µm.
Measuring time: 5-40 seconds.
Z-platform: 0-140 mm.
Detector: 25 mm2 SSD. X-ray source: 50kV
Minimum test area: 0.02 mm2.
Sample chamber: 430x400x140 mm (WxDxH).
Dimensions: 485x588x505 mm (WxDxH).
Voltage: AC 220V +/- 5V on regulated power supply.
NEW DEVICE
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Objektnummer B00043492
ID-number 43492
Object name Skyray EDX 2000A
Status New Device The article is brand new and unused. Regarding new equipment the guarantee/warranty conditions of the corresponding manufacturer apply.
Manufacture Skyray
Shipping 4-6 weeks

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Product group: SCHI

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