More Information
Objektnummer	B00015379
ID-number	015379
Object name	Philips XL 30 SFEG
Status	Archiv

Status, terms of delivery and payment

Verification of devices

The second-hand devices are verified by Labexchange Service GmbH before delivery. You are receiving only fully functional devices.

Dispatch time

The stated dispatch times are the shortest possible ones for each article. The effective dispatch times can vary. The effective dispatch times will be stated in the order confirmation.

As a matter of principle, we are offering collective deliveries. The shipping time is calculated based on the position with the longest lead time. A partial delivery is possible on explicit request.

Shipping methods

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Delivery information

Prices exclude shipping costs. Stated shipping costs are to be expected. Deviations are possible. If transport costs are not specified, please ask separately for them.

The stated transport and packing charges apply to the most favorable route if transport and are to be understood as subject to verification due to unexpected cost increases. By reason of unpredictable events, cargo rates and delivery times can change at any time and therefore have to be adapted to the recent situation. Import formalities and possible customs charges will be borne by the purchaser. Incoterm coding according to Incoterms 2010: For persons who collect the devices themselves: EXW, for dipatch by sea: CFR, by air freight: CPT, other shipments: DAP. Note for international shipments: A proof of preference/EUR1 will not be issued by us. When self-collecting/ordering EXW from countries within or outside the European Union, 16% VAT will be retained as a deposit until we have received the corresponding confirmation of arrival/bill of delivery from the buyer.

Terms of payment

We do not accept payment by letter of credit, PayPal, etc. In each case the invoice amount is payable without deduction. Discount is not granted.

Country	Possible payment methods	Comment
DE, AT, CH	Payment by invoice, payment in advance, paymet by credit card	Payment by invoice is only possible for corporate clients.
NL, BE, LU	Payment by invoice, payment in advance, payment by credit card	Payment by invoice is only possible for corporate clients
Other countries	Payment in advance, payment by credit card

Our General Terms of Sale, Delivery and Payment are valid and are available for download here.

The goods are offered subject to prior sale.

Definition of status

All articles are used articles, except an article is listed especially as a new device.

Status	Condition	Comment
Immediately available	Used	The article is fully functional and in impeccable condition. It can be shipped immediately.
In stock	Used	The article is on stock. Our service technicians will verify the article before delivery. You are receiving only a fully functional article.
Published	Used	The article is still with the provider. After your order the article will be purchased and verified by us before being shipped to you. A certificate of operativeness as well as a service report are included in delivery.
New device	new	The article is brand new and unused. Regarding new equipment the guarantee/warranty conditions of the corresponding manufacturer apply.
Labprocure	Used	Labprocure GmbH, as the advertiser, is responsible for the content of this device offer. Labprocure assumes liability for the offers advertised here and for the photos and offer texts included. Labprocure GmbH, Bruckstraße 58, 72393 Burladingen.

Firma: Philips

Modell: XL 30 SFEG

Kommentar: Dokumente engl.

The following illustrations and descriptions are referring to the instrument model and are drawn from brochures. They are not representing the delivery volume. The exact delivery content you will find only in the offering text.

FEI XL30-SFEG

High-resolution Scanning Electron Microscope

The XL30-SFEG is a high-resolution scanning electron microscope capable of resolutions better than 2 nm, magnifications over 600 kX, and operating voltages from 200 volts up to 30 kV with 1 kV and 2 kV being routine. At the lower beam potentials one can obtain excellent topographic detail and minimum charging while at the higher potentials one can get the optimum resolution and perform efficient EDS analyses. It also offers three imaging modes, each of which can be used simultaneously and blended to provide the desired image. This instrument is also fully computer controlled, making this a very easy to use system.

This instrument includes an EDAX Phoenix EDS system and a TexSEM Laboratories EBSD system. The EDS (energy dispersive xray spectroscopy) system can be used for elemental analyses and is capable of detecting carbon, nitrogen and oxygen. The EBSD (electron backscatter diffraction) system provides crystallographic information about regions of a specimen down to 20 nm (very best case). EBSD analyses determine crystal structure and orientation and are used to measure such things as crystallographic texture and determine the number and types of twins and grain boundaries.

When combined with data from the EDS system and by searching databases, such as the JCPDS database, it can be used for phase identification. The combination of advanced, high-resolution imaging, elemental analysis and crystallographic mapping makes this a very powerful research tool.

Offline processing of images, EDS spectra and EBSD data can be done using any of the computers in the Image Processing Laboratory which is located right around the corner.

Specifications

XL30-SFEG

Source Schottky-emitter, automatic gun configuration control, optimized for the whole voltage range, 0.10 to 30 kV accelerating potential (focus compensated) and 1pA to 25 nA beam current, stable to better than 0.2% per hour.

Resolution 1.5 nm at 10 kV or higher, 2.5 nm at 1 kV

Detectors SEI, BSE, in-lens, STEM

Images Images can be captured at resolutions up to 4k x 3k and saved as tiff files.

Stage 50 mm x 50 mm X-Y travel, 360° rotation, -15° to 75° tilt (-15° to 45° for large specimens), compucentric rotation, 1 to 60 mm working distance, all five axes are under computer control

Software Windows NT-based software with a multi-user shell.

The XL NT Docu software provides image database management features.

EDAX Phoenix EDS

Detector Ultra-thin windows Si-Li detector, 139 eV resolution, 5 mm working distance.

Software Windows NT-based, beam and stage control, auto-ZAF,

spectral mapping, x-ray mapping, image analysis

Product group: Electron microscopes

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