The Optima 4300 DV ICP-OES delivers the performance necessary to maximize productivity. While other concurrent ICPs claim speed, only the Optima 4000 DV Series features the optimized design needed to ensure accuracy, improve method development, and consistently deliver the right answer. The system is ideal for laboratories with medium to heavy volumes of difficult samples. The high-energy Echelle-based Optima polychromator uses one or two SCD detectors, depending on the Optima model. The measured resolution of the system is 0.006 nm at 200 nm. The 80 x 160 mm Echelle grating (manufactured by PerkinElmer) has 79 lines per mm and a bubble angle of 63.4 degrees. With the Optima 4300 DV, a 60 degree fused quartz prism is added as a cross-disperser for the visible range (403 - 782 nm). The UV disperser in all Optima 4000 DV series of spectrometers integrates a Schmidt correction into its surface to eliminate aberrations for the 400mm radius camera sphere. The entire optical system is installed in a purged and thermostatized optical housing. The optical housing is mounted on the same large optical bench as the sample introduction system. The optical bench is mounted to the frame of the instrument in a shock-absorbing manner so that normal ground vibrations do not affect system performance. Plasma viewing. With the patented dual-view capabilities of the Optima 4000 DV Series (US Patent No. 5,483,337), plasma viewing is achieved through computerized control of a mirror in the optical path, allowing selection of axial or radial viewing and adjustment of plasma viewing in either, the vertical and horizontal planes. The viewing position can be optimized by the software. Shutter and Hg recalibration system. The computer-controlled, pneumatically operated shutter opens and closes automatically for each sample. Closing the shutter between each sample protects the first transfer mirror from long exposures to the plasma's intense UV radiation, extending the useful life of the mirror. A mercury lamp is built into the shutter mechanism and can be viewed when the shutter is closed to monitor the mercury emission line at 253 nm and automatically update the system's wavelength calibration. The automatic recalibration frequency is user selectable between 0 and 1000 minutes and can be varied during an autosampler analysis. Detector. The patented PerkinElmer Segmented Array Charge-Coupled Device (SCD) detectors (US Patent No. 4,820,048) consist of 235 addressable subarrays, with over 6000 pixels on a 13 x 19 mm silicon substrate. Typical readout noise is about 13 electrons RMS; Dark current is less than 100 electrons/pixel/second; and the readout speed is 50 µsec/pixel. Correlated double sampling data acquisition electronics further reduces electronic noise Labprocure is responsible for this device.